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Energy dispersive X-ray fluorescence spectrometer TDX8600
Energy dispersive X-ray fluorescence spectrometer TDX8600
Product details
Energy dispersive X-ray fluorescence spectrometer TDX8600
Release time: June 21, 2020 Click through rate:

Application scope:ROHS testing Alloy testing Coating thickness detection Elemental Composition Analysis
Product Features
1. TDX8600 is a product specifically designed for environmental directives such as halogen-free, RoHS, EN71, etc.
2. Breaking the traditional straight line design of instruments, adopting a streamlined integrated design, the instrument is stylish and elegant.
3. Adopting a new type of Si pin detector from the United States, electrically cooled instead of liquid nitrogen cooled, with small size, accurate data analysis, and low maintenance cost.
4. Adopting the independently developed SES signal processing system, the sensitivity of the measurement is effectively improved, making the measurement more accurate.
5. One click automatic testing, simpler and more convenient to use, with a more user-friendly interface.
6. Seven types of optical path calibration and collimation systems, automatically switching according to different samples.
7. Multiple anti radiation leakage design, radiation protection level belongs to the highest level of similar products.
8. Optimize the integrated heat dissipation design to greatly improve the overall heat dissipation performance and ensure the safe operation of core components.
9. The unique temperature monitoring technology of the movement ensures the safe and reliable operation of the radiation source, effectively extending its service life and reducing usage costs.
10. Multiple instrument accessory protection system, and can be monitored throughout the entire process through software, making the instrument work more stable and safe.
11. ROHS dedicated testing software, standard window design, user-friendly interface, easy to operate.
12. This machine adopts USB 2.0 interface, effectively ensuring accurate, high-speed and efficient data transmission.
Main hardware configuration of the instrument
1 Si pin electrically cooled semiconductor detector: (latest detector)
1.1. Si pin electrically cooled semiconductor detector; Resolution: 149 ± 5 electron volts
1.2. Amplification circuit module: detects sample characteristic X-rays; Further amplify the information collected through detection.
2 X-ray excitation device:
2.1. Maximum output of filament current: 1mA;
2.2 . Belongs to a semi consumable component with a service life greater than 20000 hours
3 High Voltage Launch Devices:
3.1. Maximum voltage output: 50kV;
3.2. Minimum 5kv controllable adjustment
3.3. Equipped with voltage overload protection
4-channel analyzer:
4.1. Convert the collected analog signals into digital signals and provide the processing results to the upper computer software;
4.2 Maximum number of lanes: 4096;
4.3 Includes signal enhancement processing function;
5 optical path filtering module
5.1 Reduce interference during the transmission of X-ray light path to ensure accurate signal reception by the detector;
5.2 Integrate the collimator with the filter;
6 collimator automatic switching module
6.1 Up to 7 options, with calibers of 8-1 #, 8-2#, 8-3#, 8-4#,6#, 4#, 2 #.
7 Filter Automatic Switching Module
7.1 Free selection and switching of five types of filters.
8 Free combination module of collimator and filter
8.1 Free combination of up to dozens of collimators and filters.
Automatic selection module for 9 working curves
9.1 Automatic selection of working curves, eliminating manual selection, avoiding human operation errors, and presenting automation and intelligence more perfectly, making operation more humane and convenient.
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